Cross References:IEC 62047-1:2005IEC 62047-2:2006IEC 62047-3:2006ISO 6892:1998ISO 15490:2000

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BS EN 62047-8. Semiconductor devices. Micro- electromechanical devices. Part 8. Strip bending test method for tensile property measurement of thin films
BSI Group , 02/18/2008
Pages: 16
